%0 Conference Paper
%T Nanoelectromechanical Binary Comparator for Edge-Computing Applications
%C Lyon, France
%I IEEE
%P 1-7
%W https://hdl.handle.net/1983/2a992856-d4cd-44c9-883f-0e0a8ee98984
%* https://doi.org/10.15223/policy-029
%@ 978-3-9826741-0-0
%U https://ieeexplore.ieee.org/document/10992913/
%B 2025 Design, Automation & Test in Europe Conference (DATE)
%A Marot, Victor
%A Krishnan, Manu Bala
%A Kulsreshath, Mukesh Kumar
%A Worsey, Elliott
%A Weerasekera, Roshan
%A Pamunuwa, Dinesh
%D 2025-3-31