@inproceedings{marozauRobustnessNanoelectromechanicalSwitches2025,
	location = {Bordeaux, France},
	title = {Robustness of nano-electromechanical switches against mechanical shock and vibration loads},
	url = {https://hal.science/hal-05323115},
	abstract = {Nano-electromechanical ({NEM}) switches offer significant potential for future computing and memory applications
due to their low power consumption and ability to operate in high-temperature and radiation-harsh environments.
However, there is a lack of studies on the robustness of {NEM} switches under mechanical loads. In this study, we
investigated the performance of 3- and 7-terminal {NEM} relays under mechanical shocks up to 5000 g and
vibrations up to 70 g. The results demonstrate that devices maintain mechanical functionality, with some variations
in the electrical characteristics. These findings underscore the potential of {NEMS} technology for reliable operation
in harsh environments, paving the way for their possible integration into next-generation electronic devices.},
	booktitle = {{ESREF} 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025},
	publisher = {Université de Bordeaux, {ADERA}},
	author = {Marozau, Ivan and Tang, Qi and Kulsreshath, Mukesh and Li, Yingying and Bleiker, Simon and Niklaus, Frank and Pamunuwa, Dinesh},
	urldate = {2026-02-06},
	date = {2025-10},
	keywords = {publication},
}