i-EDGE outcomes

Researcher's perspective – Ardawan Elahi – TU Wien
PhD student's perspective – Yingying Li – KTH
Researcher's perspective – Victor Marot – University of Bristol
Researcher's perspective – Simon Bleiker — KTH
Exploitation manager's perspective – Piers Tremlett - Microchip Technology
PhD student's perspective – Philipp Lehninger – TU Wien
Coordinator's perspective – Jens Bolten – AMO GmbH
Professor's perspective – Dinesh Pamunuwa – University of Bristol

Introductory videos

A dive into i-EDGE technology
i-EDGE – Integrated layout, design and simulation tool, Elliot Worsey (University of Bristol)
Introductory video
Final workshop
  • “High Temperature and Radiations – Hard Electronics Using Nanomechanical Relays”
  • 2 July 2026, 9:00–12:30 GMT
  • Cambridge, UK
Go to the workshop page
Second workshop
  • “i-Edge”
  • 21 February 2024, 4–6pm CEST
  • Online meeting
Go to the webinar page
First workshop
  • “i-Edge” - a miniaturised rugged sensor/actuator platform
  • 4 October 2023, 11am–1pm CEST
  • Online meeting
Go to the webinar page
1.
Lehninger, P., Steininger, A., Jantsch, A.
Effect of Self-Timed Design Styles on the Lifetime of NEMS Circuits.
in 2026 30th International Symposium on Asynchronous Circuits and Systems (ASYNC) 88–91 (2026). doi: 10.1109/ASYNC69614.2026.00022. Archive: repositum TUWIEN
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2.
Chen, J., Schormans, M., Que, Z., Pamunuwa, D., Li, J.
A Clock-Independent, Time-Domain Rapid Calibration Method for Memristor-based Analog Computing AI Processors.
in 2026 IEEE International Symposium on Circuits and Systems (ISCAS) 4123–4126 (2026). doi: 10.1109/ISCAS66217.2026.11562592. Archive: Bristol Research Portal
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3.
Lehninger, P., Elahi, A., Schnöll, D., Jantsch, A., Sauter, T.
Hardware-Efficient System State Detection for Embedded Condition Monitoring.
IEEE Sensors Letters 10, 1–4 (2026). doi: 10.1109/LSENS.2026.3682499. Archive: repositum TUWIEN
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4.
Marozau, I. et al.
Mechanical shock and vibration testing of volatile and non-volatile nanoelectromechanical switches.
Microelectronics Reliability 176, 115980 (2026). doi: 10.1016/j.microrel.2025.115980. Archive: Bristol Research Portal
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5.
Li, Y.
Advances in Nanoelectromechanical Switch Integration : From Device-Level Fabrication to Circuit-Level Implementation.
(KTH Royal Institute of Technology, 2026). https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-382596
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6.
Li, Y. et al.
A CMOS-compatible heterogeneous 3-D integration platform for silicon nanoelectromechanical switches.
IEEE Electron Device Letters 1–1 (2026). doi: 10.1109/LED.2026.3655495. Archive: Bristol Research Portal
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7.
Liao, G. et al.
Nanoelectromechanical Voltage-to-Time Converter for Low-Power IoT Devices.
Journal of Microelectromechanical Systems 1–3 (2026). doi: 10.1109/JMEMS.2026.3679413. Archive: Bristol Research Portal
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8.
Timmer, J., Elahi, A., Lehninger, P., Jantsch, A.
A Low-Resource Hardware Design for Bearing Fault Detection Using Support Vector Machines.
IEEE Access 14, 31316–31326 (2026). doi: 10.1109/ACCESS.2026.3666778. Archive: repositum TUWIEN
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9.
Liao, G., Weerasekera, R., Pamunuwa, D.
Nanomechanical Self-Timed Power Management Circuit for Low-Power IoT Devices.
in 2025 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) 1–5 (2025). doi: 10.1109/APCCAS67402.2025.11376800. Archive: Bristol Research Portal
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10.
Marozau, I. et al.
Robustness of nano-electromechanical switches against mechanical shock and vibration loads.
in ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 (Université de Bordeaux, ADERA, 2025). Archive: Bristol Research Portal
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11.
Rudolf, D., Elahi, A., Jantsch, A., Pamunuwa, D.
A Fault-Tolerant Voter Circuit in NEM Technology.
in 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 1–6 (2025). doi: 10.1109/DFT66274.2025.11257557. Archive: Bristol Research Portal
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12.
Li, Y. et al.
Volatile and non-volatile nano-electromechanical switches fabricated in a CMOS-compatible silicon-on-insulator foundry process.
Microsystems & Nanoengineering 11, 140 (2025). doi: 10.1038/s41378-025-00964-w. Archive: PMC
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13.
Li, Y. et al.
Volatile and Non-Volatile Nanoelectromechancial Switches with Ruthenium-Enhanced Nano Contacts.
in 2025 23rd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) 2098–2101 (2025). doi: 10.1109/Transducers61432.2025.11110616. Archive: diva
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14.
Marot, V., Pamunuwa, D.
Nanomechanical Relay-based Switchblock For FPGA Interconnect.
in 2025 IEEE International Symposium on Circuits and Systems (ISCAS) 1–5 (IEEE, 2025). doi: 10.1109/ISCAS56072.2025.11043259. Archive: Bristol Research Portal
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15.
Tang, Q. et al.
Measurement and Analysis of Dynamic Energy Consumption in Microelectromechanical Relays.
in 2025 IEEE International Symposium on Circuits and Systems (ISCAS) 1–5 (IEEE, 2025). doi: 10.1109/ISCAS56072.2025.11043513. Archive: Bristol Research Portal
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16.
Lehninger, P. et al.
Muller C-Element for NEMS.
in 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) 56–62 (IEEE, 2025). doi: 10.1109/ASYNC65240.2025.00016. Archive: repositum
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17.
Tang, Q., Pamunuwa, D., Weerasekera, R.
DT2HDL: A Binary Decision Tree to HDL Generation Tool.
in 2025 26th International Symposium on Quality Electronic Design (ISQED) 1–8 (2025). doi: 10.1109/ISQED65160.2025.11014334. Archive: Bristol Research Portal
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18.
Marot, V. et al.
Nanoelectromechanical Binary Comparator for Edge-Computing Applications.
in 2025 Design, Automation & Test in Europe Conference (DATE) 1–7 (IEEE, 2025). doi: 10.23919/DATE64628.2025.10992913. Archive: Bristol Research Portal
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19.
Marot, V., Kulsreshath, M. K., Tang, Q., Krishnan, M. B., Pamunuwa, D.
Reconfigurable Non-Volatile 4-Way Routing Switch with Zero Standby Power.
in 2025 IEEE 38th International Conference on Micro Electro Mechanical Systems (MEMS) 611–614 (IEEE, 2025). doi: 10.1109/mems61431.2025.10917544. Archive: Bristol Research Portal
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20.
Lehninger, P.
Context-aware sensor data monitoring on NEMS technology.
(TU Wien, 2025). https://repositum.tuwien.at/handle/20.500.12708/212819
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21.
Marot, V.
Nanoelectromechanical Circuits for Low Energy Edge Computing.
(University of Bristol, 2025). Archive: Explore Bristol Research
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22.
Rudolf, D.
Fault-tolerant Design Techniques for Nano-Mechanical Circuits.
(TU Wien, 2025). https://repositum.tuwien.at/handle/20.500.12708/212004
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23.
Tang, Q. et al.
Energy Consumption in Micro-and Nanoelectromechanical Relays.
IEEE Transactions on Electron Devices 1–8 (2025). doi: 10.1109/TED.2025.3537945. Archive: Bristol Research Portal
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24.
Theimer, O.
Pass-through logic optimizations in NEM technology.
(Technische Universität Wien, 2025). doi: 10.34726/hss.2025.130982
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25.
Worsey, E., Tang, Q., Krishnan, M. B., Kumar Kulsreshath, M., Pamunuwa, D.
Nanoelectromechanical analog-to-digital converter for low power and harsh environments.
in 2024 IEEE International Symposium on Circuits and Systems (ISCAS) 1–5 (IEEE, 2024). doi: 10.1109/ISCAS58744.2024.10558630. Archive: Explore Bristol Research
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26.
Worsey, E.
Nanoelectromechanical technology for radiation and temperature harsh environments.
(University of Bristol, 2024). Archive: Explore Bristol Research
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27.
Kulsreshath, M. K. et al.
Digital Nanoelectromechanical Non-Volatile Memory Cell.
IEEE Electron Device Letters 45, 728–731 (2024). doi: 10.1109/LED.2024.3362956. Archive: Explore Bristol Research
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28.
Tang, Q.
Design, Fabrication and Characterisation of Micro and Nano-electromechanical(MEM/NEM) Relays for Circuit Applications.
(Bristol). https://research-information.bris.ac.uk/en/studentTheses/design-fabrication-and-characterisation-of-micro-and-nano-electro/
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i-EDGE has received funding from the European Union (grant number 101092018), the Swiss State Secretariat for Education, Research and Innovation (SERI) and UK Research and Innovation (UKRI) under the UK government's Horizon Europe funding guarantee (grant numbers 10061130 and 10063023).

Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union, European Health and Digital Executive Agency (HADEA), SERI or UKRI. Neither the European Union nor the granting authorities can be held responsible for them.

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